Technology advances in the world of semiconductors and microprocessors are increasing at a breathtaking pace. The density of transistor population on integrated circuits has increased at a rate unimaginable just a few years ago. The advantages are many: faster data acquisition, real time control, and fully automated factories, to name a few. Semiconductor technology is also prevalent in field mounted instrumentation and electronic measurement devices. Unfortunately, a tradeoff to the increased performance is the susceptibility of these semiconductor devices to voltage and current transient events. The minimum results are unreliable instrumentation readings and operation, with periodic failures. The worst case result is a completely destroyed measurement device